Microscopy for cleanliness analysis

With light microscopy and scanning electron microscopy (SEM) pollution on filter membrans can be evaluated. The particles on the filter can be counted and measured. As result of the analysis you can get a particle size distribution.

The function of a component can be affected by one or just a few of critical particles. So it is necessary, to count the complete analysis filter membrane. CleanControlling uses for light microscopy a computer-controlled system from Jomesa which counts and measures particles automatically. So can be reached exact and repeatable results. In addition there is a determination between metalic and non metalic particles.

For scanning electron microscopy CleanControlling cooperates with the laboratory for materials WITg.